QD-1023 Advanced IDDQ measurement instrument.

QD-1023 Advanced IDDQ measurement instrument.

$4,250.00

  • Wide DUT Supply range: VDUT = 0.5V to 7V
  • Wide measurement range: IDDQ = 0 – 30mA
  • Typical measurement time: 100 µs
  • High capacitive driving capability: up to 10µF
  • High single sample resolution: 20nARMS
  • 16-bits IDDQ Value Read Out
  • 3-Wire Serial Configuration/Read out Interface
  • On-board data processing capabilities

Datasheet QD-1011

SKU: QD-1023 Category:
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Description

QD-1023 Advanced IDDQ measurement instrument.

QD-1023 – QD-1020 based instrument adapted for high voltage (VDUT > 7V) applications.

FEATURES

  • Wide DUT Supply range: VDUT = 0.5V to 7V
  • Wide measurement range: IDDQ = 0 – 30mA
  • Typical measurement time: 100 µs
  • High capacitive driving capability: up to 10µF
  • High single sample resolution: 20nARMS
  • 16-bits IDDQ Value Read Out
  • 3-Wire Serial Configuration/Read out Interface
  • On-board data processing capabilities
APPLICATIONS

  • ATE Probe Card Applications
  • ATE Interface Board Applications
  • Delta IDDQ Measurements
  • Pre & Post Stress Delta IDDQ
  • IDDQ Pass/Fail Measurements
  • IDDQ Read Out Measurements
  • IDDQ Window Comparisons

 

The QD-1011 is a full featured, advanced configurable quiescent supply current (IDDQ) measurement instrument, supporting both probe and final test and designed for probe card and interface board applications. The instrument supports a wide range of IDDQ test and measurements applications and provides digital measurement values as well as a pass/fail output signal. On-board memory and data processing capabilities allow implementing various advanced current based test strategies including but not limited to a wide range of Delta-IDDQ approaches

The QD-1011 operates according to the Stabilised Voltage Drop principle and is designed to be inserted between the Automated Test Equipment (ATE) device power supply and  the supply pin(s) of the Device Under Test (DUT). There is no need to remove the local decoupling capacitors. Its unique

design ensures transparency to both the ATE and DUT, under all conditions. The unit can drive high capacitive loads (up to several µF).

The QD-1011 offers the capability to perform accurate (better than 50nA @ 10kHz) and highly repeatable high speed (up to 10kHz) quiescent supply current measurements. On-board data processing allows improving the accuracy further at the cost of a small speed penalty.

The instrument has a wide measurement range (0-30mA). The serial output provides the Pass/Fail flag and/or the measured/processed IDDQ values with a 16-bit resolution. The QD-1011 requires only a single positive supply, and allows a user programmable (0.5 to 7V) DUT supply level.

The QD-1011 has an on-board compensated bypass switch, which minimises charge transfers and is capable of transferring large transient currents. To assure DUT supply stability, the bypass switch is automatically activated when the measured current is out of the instrument’s measurement range.

By default the QD1011’s Current Measurement Unit (CMU) is optimised to perform an IDDQ measurement in 100µs for a 100nF to 10µF capacitive load. The processing and read out time is function of the application and takes typically 20µs. The default measurement range of the QD1011 is set to 0-1mA with a single sample resolution of 90nARMS. Other possible fixed measurement ranges are 0-100µA and 0-10mA with a single sample resolution of 50nARMS and 400nARMS respectively. All these parameters can be customised for optimal performance in function of desired measurement speed/resolution and actual loading conditions. In addition to the digital readout capabilities, the QD- 1011 also provides an analogue output VIDDQ that can be measured by the ATE.

 

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