EBERT 2904 Key Futures
- Four channel NRZ Pulse Pattern Generator and Error Detector
- Operating range between 6 to 29.5 Gb/s along with /2 rates
- Typical JRMS of 1 ps and JPP of 6 ps
- PRBS patterns of 2^7, 9, 15, 23, 31 and error insertion
- Non-destructive eye monitor
- Adjustable internal clock synthesizer with PPM offset control
- Adjustable clock output frequency and amplitude
- External clock input to synchronize parallel test systems
- Adjustable 200 to 1100 mV PPDIFF output with squelch
- Adjustable Pre and Post cursor emphasis control
- TX and RX polarity inversion
- Loss of signal indicator
- 40 bit programmable fixed pattern
- USB 0 controlled with API command set or GUI software
- Stand alone configuration options available (consult the factory)
- Small footprint size of 216w x 60h x 140d mm
- Integrated cooling fan
- 1 year warranty
Ebert 2904 DESCRIPTION
The Ebert 2904 is a high performance, flexible and cost effective four channel Pulse Pattern Generator (PPG) and Error Detector (ED) that can operate from 24.6 to 29.5 Gb/s along with half rates (consult factory for higher or lower operation). It is capable of generating a Pseudo Random Bit Sequence (PRBS) or a user defined 40 bit fixed pattern to test signal integrity of digital communication system links. PRBS patterns of 2^7, 9, 15, 23, 31 are supported. It is a standalone Bit Error Rate (BER) test solution that incorporates an internal full rate clock synthesizer therefore avoiding the expense of an external precision clock source.
Its small size allows it to be placed close to the Device Under Test (DUT) or further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive integrated eye outline capture feature along with a quick eye height and width measurement capability.
It incorporates internal AC coupling capacitors on all ports to avoid CML bias issues and to protect the equipment along with the DUT. The PPG TX output has typical JPP of ~6 ps and JRMS of ~1 ps along with an adjustable range of 200 to 1100 mV PPDIFF providing a wide test range that could include crosstalk measurements. Other features include squelch, polarity inversion, loss of signal and error insertion.
The system is controlled through a USB 2.0 compliant port and supplied GUI to evaluate the performance of the system. An API command set is used for ease of integration into existing factory software automation control. The GUI includes a API tab so you can easily view the command architecture.
The 2904 accessories include: AC power cord, power supply, USB cable,
GUI software and user manual.
Optional features: Tilt bar, custom power up configuration for standalone operation, parallel I/O control, dip switch control, LED status diagnostics, individual PPG or ED configurations, face plate for 19 inch rack attachment, loop back cables or adding attenuators to the ED to adjust sensitivity.
EBERT 2904 APPLICATIONS
The Ebert 2904 PPG and ED is a standalone test system or can be used in conjunction with other high speed test equipment for additional testing capability. Its capability to measure every bit of the incoming pattern is used as a tool to measure reliability and performance of communication links to determine BER over time or by changing parameters of the link. The PPG can be used by itself with a high bandwidth oscilloscope to measure a DUT’s performance looking for common attributes associated with digital eye diagrams such as jitter. The ED can be used by itself as a receiver in a communication link to monitor the incoming pattern to determine the performance of a system where the source is physically located off-site.
It has the capability of locking the synthesizer to an external clock source for use with other external test equipment or to run multiple 2904 systems in parallel to expand to higher port counts. The system has a PPM offset control feature to system tolerances or to adjust its aging over time.
The high fidelity performance also lends itself for testing in non- retimed links where the source needs to have low intrinsic jitter so it can be determined how much the DUT is contributing to the system link test. The ED has high sensitivity for applications that need this requirement or the use of external attenuators can be used to move the sensitivity to higher levels. Contact the factory if you would like to have the ED sensitivity changed to a higher level using a custom part number.
The eye capture feature also can give insight to the quality of the incoming digital signal such as eye width and shape It’s not intended to replace a high speed scope, but can give you information about the eye symmetry and crossing width as the ED incorporates a limiting amplifier for increased sensitivity.
The 2904 was designed to characterize high speed digital links during the engineering, manufacturing or installation phases of a project. Such applications could include the testing of IC’s, optical components, transceivers, copper cables, back planes and interconnects. The 2904 can be used for compliance testing of Ethernet, Fiber Channel, Infiniband, PCIE, SONET and proprietary link standards.
|Absolute Maximum Ratings||Symbol||Min.||Typ.||Max.||Unit||Notes|
|AC Voltage Range||VAC||90||–||246||VAC|
|AC Voltage Frequency Range||VFREQ||47||–||63||Hz|
|Data RF Voltage Input||VinData||-0.3||–||1.2||V|
|Clock In Voltage Input||VinClk||0||–||1.8||V|
|USB Pin Voltage||VinUSB||-0.3||–||5.5||V|
|RF and Clock ESD HBM||RFesdH||-1000||–||1000||V|
|RF, Clock and USB Latchup||Vl||-100||–||100||mA|
|USB ESD HBM||USBesdH||-2000||–||2000||V|
|USB ESD CDM||USBesdC||-500||–||500||V|
|AC Supply Current||Icc||0.75||300||–||mA|
|Baud Rate (NRZ format)||BR||12.3/14.75||24.6/29.5||Gb/s|
|Baud Rate Setpoint Accuracy||BRa||-10||–||+10||PPM||(Note 1)|
|Baud Rate PPM Offset||BRo||-999||–||999||PPM||1 PPM step size|
|Power On Initialization Time||Ton||–||–||8||Seconds|
|Eye Phase Steps||EMp||–||–||128||Steps||.31 pS per unit|
|Eye Amplitude Steps||EMv||–||–||64||Steps||6.25 mV per unit|
|Note 1: Aging, Temperature and Voltage|
|CML Output (Single Ended)||VoutSE||100||–||550||mVpp||AC Coupled|
|CML Output (Differential)||VoutDIFF||200||–||1100||mVpp||AC Coupled|
|CML Output (Differential) Step
|CML Output (Differential) Squelch||VoutSqu||0||–||20||mVpp|
|CML Output (Rise/Fall Time)||tR, tF||–||12||–||ps||20-80%|
|Output Impedance (differential)||Zout||–||100||–||Ω|
|AC common mode voltage||TACcm||–||–||15||mVRMS|
|Differential Return Loss||SDD22||-10||–||–||dB|
|Jitter (RMS)||TJrms||–||1||–||pS||(Note 2)|
|Jitter (PK-PK)||TJpp||–||5||–||pS||(Note 2)|
|Note 2: Agilent DCA-X with 50 GHz plug-in, 23-1 PRBS pattern and 500 waveforms using a precision time base
|Baud Rate Tolerance||BRt||-100||–||+100||PPM|
|CML Input Voltage (Single Ended)||VinSE||200||–||600||mVpp||AC Coupled|
|CML Input Voltage (Differential)||VinDIFF||100||–||1200||mVpp||AC Coupled|
|Input Impedance (Differential)||Zin||–||100||–||Ω|
|Differential Return Loss||SDD11||-10||–||–||dB|
|CDR Acquisition Lock Time||CDRl||–||–||500||mS|
|Clock – Input||Symbol||Min.||Typ.||Max.||Unit||Notes|
|Single Ended Voltage Swing||CVpp||0.3||–||1.8||V|
|Input Impedance||CRin||49.5||50||50.5||Ohm||AC coupled|
|Rise/Fall Time||CitR, CitF||–||–||1||nS||20%-80%|
|Duty Cycle||CDC||40||–||60||%||<1nS Tr/Tf|
|Random Jitter (RMS)||CRj||–||–||1||ps||12 kHz–20 MHz|
|Clock – Output||Symbol||Min.||Typ.||Max.||Unit||Notes|
Programmable Divider of Line Rate
Factors of 2
|Single Ended Voltage Swing||CVoutSE||200||–||400||mVp||AC coupled|
|Termination Mismatch||CZm||0||–||5||%||At 1 MHz|
|Rise/Fall Time||COtR, COtF||–||12||–||ps||20-80%|
|Ouptut Return Loss||CS22||-10||–||–||dB|
|Jitter (RMS)||CJrms||–||–||750||fs||(Note 3)|
|Jitter (PK-PK)||CJpp||–||–||3.5||ps||(Note 3)|
|Note 3: Using Agilent DCA-X with 50 GHz plug-in. 500 waveforms using a precision time base trigger|
|Note 4: Terminate clock output if not used|