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AE8500 Optical Spectrum Analyzer
- Analyze a full range of communication wavelengths and
spectrum channels (1250 ~ 1650nm) - Test transmission characteristics of optical devices
- Outstanding wavelength & power accuracy, with λ resolution
up to 0.06nm - Wide selection of test modes – including WDM, OLS, and EDFA –
are perfect for applications from field to factory - Diagnose and monitor key parameters of DWDM signals to
check system stability - View all DWDM channel characteristics at 50 / 100 GHz intervals
- Store and transfer data with LAN, USB, SD, and more
- Description
- Additional information
- Specifications
Description
AE8500 Optical Spectrum Analyzer
The AE8500 is a high precision, high-resolution optical spectrum analyzer with measurement wavelength range of 1250 to 1650nm. Users can test optical signals with excellent accuracy, and the 12.1″ LCD touchscreen and concise UI design make the AE8500 easy to master. It also provides customizable CWDM/DWDM testing, in-band OSNR, light source, EDFA, fiber probe, auto testing, and more. The AE8500 meets the optical spectrum analysis requirements for several years to come – at superior cost-performance.
| Overview | Main Features |
| Brought to you by Deviser Instruments, Inc., the AE8500 is a high-precision diffraction-grating OSA with a wavelength range of 1250 ~ 1650nm and power sensitivity down to 70dBm. Users can test optical signals with excellent accuracy, and the 12.1″ LCD touchscreen and concise UI design make the AE8500 easy to master. It also provides a powerful suite of test modes, including WDM system testing, EDFA, transmittance and drift testing, and semiconductor laser spectrum scans (DFB & FP). The AE8500 offers exceptional stability and reliability, high-speed spectral sweeping, and multiple ways to output and analyze your data. It’s the ideal tool for CWDM/DWDM and FTTH project maintenance. |
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| Spectrum Analysis | Additional Tests |
| The AE8500’s main OSA mode shows the spectrum trace in split-screen format. View detailed peaks and valleys in the central window, with the overall waveform in the top-right for the perfect balance of broad and narrow analysis. | The AE8500 offers a broad suite of optical measurement modes, granting technicians a complete picture of the test signal. These include EDFA (erbium-doped fiber amplifier), FP-LD (Fabry-Pérot laser diode), and DFB (distributed-feedback laser diode). |
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Additional information
| Weight | 17.9 kg |
|---|---|
| Dimensions | 39.4 × 23.0 × 26.4 cm |
| OSA Technical Parameters | ||
| Wavelength range | 1250 ~ 1650nm | |
| Resolution bandwidth | 0.06nm | |
| Resolution settings | 0.06, 0.1, 0.2, 0.5, 1, 2nm | |
| Wavelength accuracy | ± 0.05nm | |
| Wavelength repeatability | ± 0.01nm | |
| Wavelength linearity | ± 0.01nm | |
| Minimum screen resolution | 0.05nm | |
| Connectors & Display | ||
| Display | 12.1″ 1280 x 800 dot-array TFT touchscreen | |
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Data transfer |
4x USB 2.0 ports* | |
| 1x RJ45 LAN port, 10M/100M | ||
| 1x RS-232 DB-9 serial port | ||
| Optical interface | SMF-UPC, FC (default); APC, SC (optional) | |
| Storage | 8GB internal hard drive; 8GB SD card (32GB max) | |
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Power supply |
AC | 90 ~ 240V, 1.5A, 50 ~ 60 Hz |
| DC | 12V 2.5A maximum | |
| Optical Power Measurement | |
| Input power range | -70 ~ +25dBm |
| Maximum peak input | 20dBm |
| Power accuracy | ± 0.5dB |
| Power linearity | ± 0.07dB |
| Optical decay rate | 38 ~ 42dB (± 0.2nm); 46 ~ 52dB (± 0.4nm) |
| Sampling points | 80,000 |
| ORL | > 35dB |
| Polarization dependence | ± 0.05dB |
| OSNR measuring dynamic | > 35dB |
| OSNR measuring uncertainty | ± 0.5dB |
| Sweep speed | 0.8 sec/400nm |
| General | |
| Operating temperature | 0 ~ +50°C |
| Storage temperature | -20 ~ +60°C |
| Dimensions (LxWxH) | 15.5″ x 9.1″ x 10.4″ (394mm x 230mm x 264mm) |
| Weight | 17.9 lbs (8.1 kg) |
