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AE8500 Optical Spectrum Analyzer

  • Analyze a full range of communication wavelengths and
    spectrum channels (1250 ~ 1650nm)
  • Test transmission characteristics of optical devices
  • Outstanding wavelength & power accuracy, with λ resolution
    up to 0.06nm
  • Wide selection of test modes – including WDM, OLS, and EDFA –
    are perfect for applications from field to factory
  • Diagnose and monitor key parameters of DWDM signals to
    check system stability
  • View all DWDM channel characteristics at 50 / 100 GHz intervals
  • Store and transfer data with LAN, USB, SD, and more

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Description

AE8500 Optical Spectrum Analyzer

The AE8500 is a high precision, high-resolution optical spectrum analyzer with measurement wavelength range of 1250 to 1650nm. Users can test optical signals with excellent accuracy, and the 12.1″ LCD touchscreen and concise UI design make the AE8500 easy to master. It also provides customizable CWDM/DWDM testing, in-band OSNR, light source, EDFA, fiber probe, auto testing, and more. The AE8500 meets the optical spectrum analysis requirements for several years to come – at superior cost-performance.

Overview Main Features
Brought to you by Deviser Instruments, Inc., the AE8500 is a high-precision diffraction-grating OSA with a wavelength range of 1250 ~ 1650nm and power sensitivity down to 70dBm.
Users can test optical signals with excellent accuracy, and the 12.1″ LCD touchscreen and concise UI design make the AE8500 easy to master. It also provides a powerful suite of test modes, including WDM system testing, EDFA, transmittance and drift testing, and semiconductor laser spectrum scans (DFB & FP).
The AE8500 offers exceptional stability and reliability, high-speed spectral sweeping, and multiple ways to output and analyze
your data. It’s the ideal tool for CWDM/DWDM and FTTH project maintenance.
  • FTTH network deployment and maintenance
  • Distributed feedback laser (DFB) and Fabry-Pérot (FP)
  • Analyze single- or multi-λ input: power, bandwidth, drift, SMSR, OSNR, and mode spacing
  • Erbium-doped fiber amplifier (EDFA) Before/after optical amplification; measure PSSE, PASE, gain, and noise factor
  • CWDM/DWDM project acceptance and maintenance
  • Resolution BW up to 60 picometers to test closely-spaced channels – critical for DWDM test aggregation
  • Measure channel power, offset, and OSNR

Spectrum Analysis Additional Tests
The AE8500’s main OSA mode shows the spectrum trace in split-screen format. View detailed peaks and valleys in the central window, with the overall waveform in the top-right for the perfect balance of broad and narrow analysis. The AE8500 offers a broad suite of optical measurement modes, granting technicians a complete picture of the test signal. These include EDFA (erbium-doped fiber amplifier), FP-LD (Fabry-Pérot laser diode), and DFB (distributed-feedback laser diode).

 

 

Additional information

Weight 17.9 kg
Dimensions 39.4 × 23.0 × 26.4 cm
OSA Technical Parameters
Wavelength range 1250 ~ 1650nm
Resolution bandwidth 0.06nm
Resolution settings 0.06, 0.1, 0.2, 0.5, 1, 2nm
Wavelength accuracy ± 0.05nm
Wavelength repeatability ± 0.01nm
Wavelength linearity ± 0.01nm
Minimum screen resolution 0.05nm
Connectors & Display
Display 12.1″ 1280 x 800 dot-array TFT touchscreen
 

Data transfer

4x USB 2.0 ports*
1x RJ45 LAN port, 10M/100M
1x RS-232 DB-9 serial port
Optical interface SMF-UPC, FC (default); APC, SC (optional)
Storage 8GB internal hard drive; 8GB SD card (32GB max)
 

Power supply

AC 90 ~ 240V, 1.5A, 50 ~ 60 Hz
DC 12V 2.5A maximum

 

Optical Power Measurement
Input power range -70 ~ +25dBm
Maximum peak input 20dBm
Power accuracy ± 0.5dB
Power linearity ± 0.07dB
Optical decay rate 38 ~ 42dB (± 0.2nm); 46 ~ 52dB (± 0.4nm)
Sampling points 80,000
ORL > 35dB
Polarization dependence ± 0.05dB
OSNR measuring dynamic > 35dB
OSNR measuring uncertainty ± 0.5dB
Sweep speed 0.8 sec/400nm
General
Operating temperature 0 ~ +50°C
Storage temperature -20 ~ +60°C
Dimensions (LxWxH) 15.5″ x 9.1″ x 10.4″ (394mm x 230mm x 264mm)
Weight 17.9 lbs (8.1 kg)